Trimming of atomic force microscope probe tip by ion milling
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my.iium.irep.177142012-07-27T07:03:03Z http://irep.iium.edu.my/17714/ Trimming of atomic force microscope probe tip by ion milling Ali, Mohammad Yeakub Lim, B.H. TA Engineering (General). Civil engineering (General) IIUM Press 2011 Book Chapter REM application/pdf en http://irep.iium.edu.my/17714/1/Chapter_43.pdf Ali, Mohammad Yeakub and Lim, B.H. (2011) Trimming of atomic force microscope probe tip by ion milling. In: Mechatronics book series: Selected papers from ICOM'01, ICOM'05 and ICOM'08. IIUM Press, Kuala Lumpur, pp. 381-385. ISBN 9789670225685 |
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TA Engineering (General). Civil engineering (General) |
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TA Engineering (General). Civil engineering (General) Ali, Mohammad Yeakub Lim, B.H. Trimming of atomic force microscope probe tip by ion milling |
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Book Chapter |
author |
Ali, Mohammad Yeakub Lim, B.H. |
author_facet |
Ali, Mohammad Yeakub Lim, B.H. |
author_sort |
Ali, Mohammad Yeakub |
title |
Trimming of atomic force microscope probe tip by ion milling |
title_short |
Trimming of atomic force microscope probe tip by ion milling |
title_full |
Trimming of atomic force microscope probe tip by ion milling |
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Trimming of atomic force microscope probe tip by ion milling |
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Trimming of atomic force microscope probe tip by ion milling |
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trimming of atomic force microscope probe tip by ion milling |
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IIUM Press |
publishDate |
2011 |
url |
http://irep.iium.edu.my/17714/1/Chapter_43.pdf http://irep.iium.edu.my/17714/ |
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