Development of Low-Cost Precision Scanner System for Scanning Probe Microscopy Application
Atomic Force Microscope (AFM), also known as “Scanning Force Microscopy (SFM)”. It is a microscope that can measure up to nanometer technology. In AFM, there is a pin, when this pin touches a bump and the pin will rise up. When the pin rise up, the laser that target to the pin and reflect to photodi...
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| Format: | Final Year Project / Dissertation / Thesis |
| Published: |
2015
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| Online Access: | http://eprints.utar.edu.my/1796/1/Development_of_Low%2DCost_Precision_Scanner_System_for_Scanning_Probe_Microscopy_Application.pdf http://eprints.utar.edu.my/1796/ |
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