High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method
High quality indium oxide and iron doped indium oxide nanocrystalline films were prepared by the sol-gel method followed by a spin coating technique. The samples were characterized by an X-ray diffractometer, an atomic force microscopy and a UV-vis spectroscopy. All samples had good crystallinity wi...
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Universiti Kebangsaan Malaysia
2013
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my-ukm.journal.63132016-12-14T06:40:49Z http://journalarticle.ukm.my/6313/ High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method Ibrahim, N.B. Baqiah, H. Abdullah, M.H. High quality indium oxide and iron doped indium oxide nanocrystalline films were prepared by the sol-gel method followed by a spin coating technique. The samples were characterized by an X-ray diffractometer, an atomic force microscopy and a UV-vis spectroscopy. All samples had good crystallinity with a preferred orientation in the (222) direction. The crystallite size increased from 12.1 nm for the pure sample to 16.1 nm for the sample with x=0.35 and then decreased to 12.1 nm for the sample with x=0.45. All samples contained nanometer grain sizes with a smooth surface. All films showed a high transmission of over 91% in the wavelength range of 200-800 nm. Universiti Kebangsaan Malaysia 2013-07 Article PeerReviewed application/pdf en http://journalarticle.ukm.my/6313/1/11_N.B._Ibrahim.pdf Ibrahim, N.B. and Baqiah, H. and Abdullah, M.H. (2013) High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method. Sains Malaysiana, 42 (7). pp. 961-966. ISSN 0126-6039 http://www.ukm.my/jsm/ |
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High quality indium oxide and iron doped indium oxide nanocrystalline films were prepared by the sol-gel method followed by a spin coating technique. The samples were characterized by an X-ray diffractometer, an atomic force microscopy and a UV-vis spectroscopy. All samples had good crystallinity with a preferred orientation in the (222) direction. The crystallite size increased from 12.1 nm for the pure sample to 16.1 nm for the sample with x=0.35 and then decreased to 12.1 nm for the sample with x=0.45. All samples contained nanometer grain sizes with a smooth surface. All films showed a high transmission of over 91% in the wavelength range of 200-800 nm. |
| format |
Article |
| author |
Ibrahim, N.B. Baqiah, H. Abdullah, M.H. |
| spellingShingle |
Ibrahim, N.B. Baqiah, H. Abdullah, M.H. High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method |
| author_facet |
Ibrahim, N.B. Baqiah, H. Abdullah, M.H. |
| author_sort |
Ibrahim, N.B. |
| title |
High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method |
| title_short |
High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method |
| title_full |
High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method |
| title_fullStr |
High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method |
| title_full_unstemmed |
High transparency iron doped indium oxide (In2—xFexO3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method |
| title_sort |
high transparency iron doped indium oxide (in2—xfexo3, x = 0.0, 0.05,0.25, 0.35 and 0.45) films prepared by the sol-gel method |
| publisher |
Universiti Kebangsaan Malaysia |
| publishDate |
2013 |
| url |
http://journalarticle.ukm.my/6313/1/11_N.B._Ibrahim.pdf http://journalarticle.ukm.my/6313/ http://www.ukm.my/jsm/ |
| _version_ |
1643736724225916928 |
| score |
13.211869 |