Sistem pemeriksaan bantuan penglihatan mesin

The development of a machine vision system for inspection of LED devices in industrial environment is discussed in the paper. Methods to detect flaws in LED devices is emphasized. There are two problem statement i.e.: (i) inspect flaws in the LED lead frame at the end of the production line and,...

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Main Authors: Ahmad Fadzil Mohamad Hani,, Chu , Jenn Weng
Format: Article
Published: 1994
Online Access:http://journalarticle.ukm.my/1312/
http://www.ukm.my/jkukm/index.php/jkukm
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spelling my-ukm.journal.13122011-10-11T03:45:25Z http://journalarticle.ukm.my/1312/ Sistem pemeriksaan bantuan penglihatan mesin Ahmad Fadzil Mohamad Hani, Chu , Jenn Weng The development of a machine vision system for inspection of LED devices in industrial environment is discussed in the paper. Methods to detect flaws in LED devices is emphasized. There are two problem statement i.e.: (i) inspect flaws in the LED lead frame at the end of the production line and, (ii) inspect wire loop flaws in the LEDs prior to epoxy encapsulation. Tests were carried out to investigate the capability of the developed machine vision system. Results obtained show a high percentage of success in distinguishing between good and bad LEDs. The generic system described here has a wide application in quality control inspection in the manufacturing environment 1994 Article PeerReviewed Ahmad Fadzil Mohamad Hani, and Chu , Jenn Weng (1994) Sistem pemeriksaan bantuan penglihatan mesin. Jurnal Kejuruteraan, 6 . http://www.ukm.my/jkukm/index.php/jkukm
institution Universiti Kebangsaan Malaysia
building Perpustakaan Tun Sri Lanang Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Kebangsaan Malaysia
content_source UKM Journal Article Repository
url_provider http://journalarticle.ukm.my/
description The development of a machine vision system for inspection of LED devices in industrial environment is discussed in the paper. Methods to detect flaws in LED devices is emphasized. There are two problem statement i.e.: (i) inspect flaws in the LED lead frame at the end of the production line and, (ii) inspect wire loop flaws in the LEDs prior to epoxy encapsulation. Tests were carried out to investigate the capability of the developed machine vision system. Results obtained show a high percentage of success in distinguishing between good and bad LEDs. The generic system described here has a wide application in quality control inspection in the manufacturing environment
format Article
author Ahmad Fadzil Mohamad Hani,
Chu , Jenn Weng
spellingShingle Ahmad Fadzil Mohamad Hani,
Chu , Jenn Weng
Sistem pemeriksaan bantuan penglihatan mesin
author_facet Ahmad Fadzil Mohamad Hani,
Chu , Jenn Weng
author_sort Ahmad Fadzil Mohamad Hani,
title Sistem pemeriksaan bantuan penglihatan mesin
title_short Sistem pemeriksaan bantuan penglihatan mesin
title_full Sistem pemeriksaan bantuan penglihatan mesin
title_fullStr Sistem pemeriksaan bantuan penglihatan mesin
title_full_unstemmed Sistem pemeriksaan bantuan penglihatan mesin
title_sort sistem pemeriksaan bantuan penglihatan mesin
publishDate 1994
url http://journalarticle.ukm.my/1312/
http://www.ukm.my/jkukm/index.php/jkukm
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score 13.211869