Pinch Current and Soft X-Ray Yield Limitations by Numerical Experiments on Nitrogen Plasma Focus
The modified version of the Lee model code RADPF5-15a is used to run numerical experiments with nitrogen gas, for optimizing the nitrogen soft X-ray yield on PF-SY1. The static inductance L0 of the capacitor bank is progressively reduced to assess the effect on pinch current Ipinch. The experim...
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| المؤلفون الرئيسيون: | , , |
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| التنسيق: | مقال |
| اللغة: | English |
| منشور في: |
Springer US
2010
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| الموضوعات: | |
| الوصول للمادة أونلاين: | http://eprints.intimal.edu.my/266/1/2.pdf http://eprints.intimal.edu.my/266/ |
| الوسوم: |
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| الملخص: | The modified version of the Lee model code
RADPF5-15a is used to run numerical experiments with
nitrogen gas, for optimizing the nitrogen soft X-ray yield
on PF-SY1. The static inductance L0 of the capacitor bank
is progressively reduced to assess the effect on pinch current
Ipinch. The experiments confirm the Ipinch, limitation
effect in plasma focus, where there is an optimum L0 below
which although the peak total current, Ipeak, continues to
increase progressively with progressively reduced inductance
L0, the Ipinch and consequently the soft X-ray yield,
Ysxr, of that plasma focus would not increase, but instead
decreases. For the PF-SY1 with capacitance of 25 lF, the
optimum L0 = 5 nH, at which Ipinch = 254 kA, Ysxr =
5 J; reducing L0 further increases neither Ipinch nor nitrogen
Ysxr. The obtained results indicate that reducing the
present L0 of the PF-SY1 device will increase the nitrogen
soft X-ray yield. |
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