Search Results - (( defect classifications _ algorithm ) OR ( code classification based algorithm ))

An improved defect classification algorithm for six printing defects and its implementation on real printed circuit board images by Ibrahim, I., Ibrahim, Z., Khalil, K., Mokji, M.M., Abu Bakar, S.A.R.S., Mokhtar, N., Ahmad, W.K.W.

“…The improved PCB defect classification algorithm has been applied to real PCB images to successfully classify all of the defects. …”
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Static code analysis of permission-based features for android malware classification using apriori algorithm with particle swarm optimization by Adebayo, Olawale Surajudeen, Abdul Aziz, Normaziah

“…In this method, permission-based features were extracted from Android applications byte-code through static code analysis, selected and were used to train supervised classifiers. …”
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Evaluation of the Transfer Learning Models in Wafer Defects Classification by Jessnor Arif, Mat Jizat, Anwar, P. P. Abdul Majeed, Ahmad Fakhri, Ab. Nasir, Zahari, Taha, Yuen, Edmund, Lim, Shi Xuen

“…The key metrics for the evaluation are classification accuracy, classification precision and classification recall. 855 images were used to train and test the algorithms. …”
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Using the bees algorithm to optimise a support vector machine for wood defect classification by Pham, D.T, Muhammad, Zaidi, Mahmuddin, Massudi, Ghanbarzadeh, Afshin, Koc, Ebubekir, Otri, Sameh

“…The objective of the work was to find the best combination of SVM parameters and data features to maximize defect classification accuracy. The paper presents the results obtained to demonstrate the strengths of the Bees Algorithm as an optimization tool.…”
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Android Malware classification using static code analysis and Apriori algorithm improved with particle swarm optimization by Adebayo, Olawale Surajudeen, Abdul Aziz, Normaziah

“…Several machine learning techniques based on supervised learning have been adopted in the classification of malware. …”
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Software defect prediction framework based on hybrid metaheuristic optimization methods by Wahono, Romi Satria

“…The classification algorithm is a popular machine learning approach for software defect prediction. …”
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Classification Analysis Of High Frequency Stress Wave For Autonomous Detection Of Defect In Steel Tubes by Abd Halim, Zakiah, Jamaludin, Nordin, Junaidi, Syarif, Syed Yahya, Syed Yusaini

“…Interpretation of propagated high frequency stress wave signals in steel tubes is noteworthy for defect identification.This paper demonstrated a successful new approach for autonomous defect detection in steel tubes using classification analysis of high frequency stress waves.Classification analysis using Principal Component Analysis (PCA) algorithm involved feature extraction to reduce the dimensionality of the complex stress waves propagation path.Two defective tubes containing a slot defect of different orientation and a reference tube are inspected using Vibration Impact Acoustic Emission (VIAE) technique.The tubes are externally excited using impact hammer.The variation of stress wave transmission path are captured by high frequency Acoustic Emission sensor.The propagated stress waves in the steel tubes are classified using PCA algorithm.Classification results are graphically illustrated using a dendrogram that demonstrated the arrangement of the natural clusters of the stress wave signals.The inspection of steel tubes showed good recognition of defect in circumferential and longitudinal orientation.This approach successfully classified stress wave signals from VIAE testing and provide fast and accurate defect identification of defective steel tubes from non-defective tubes. …”
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The formulation of a transfer learning pipeline for the classification of the wafer defects by Lim, Shi Xuen

“…Automated processes have been used commonly in recent years, with the judgement done by using conventional image processing algorithm. However, limitations such as robustness and difficulty in setting up the parameters required for image processing algorithm encourages the investigation in using Deep learning classification in detecting the wafer defects. …”
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An improved defect classification algorithm for six printing defects and its implementation on real printed circuit board images by Ismail, Ibrahim, Zuwairie, Ibrahim, Kamal, Khalil, Musa, Mohd Mokji, Syed Abdul Rahman, Syed Abu Bakar, Norrima, Mokhtar, Wan Khairunizam, Wan Ahmad

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Evaluation of the machine learning classifier in wafer defects classification by Jessnor Arif, Mat Jizat, Anwar, P. P. Abdul Majeed, Ahmad Fakhri, Ab. Nasir, Zahari, Taha, Yuen, Edmund

“…The key metrics for the evaluation are classification accuracy, classification precision and classification recall. 855 images were used to train, test and validate the classifier. …”
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Network Traffic Classification Analysis on Differentiated Services Code Point Using Deep Learning Models for Efficient Deep Packet Inspection by Ahmed Khan, Fazeel, Abubakar, Adamu

“…Most of the algorithms got promising results and classify packets based on DSCP accurately. …”
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Neural network paradigm for classification of defects on PCB by Heriansyah, Rudi, Syed Al-Attas, Syed Abdul Rahman, Zabidi, Muhammad Mun'im Ahmad

“…The algorithms to segment the image into basic primitive patterns, enclosing the primitive patterns, patterns assignment, patterns normalization, and classification have been developed based on binary morphological image processing and Learning Vector Quantization (LVQ) neural network. …”
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CLASSIFICATION OF BEARING FAULTS USING EXTREME LEARNING MACHINE ALGORITHMS by TEH, CHOON KEONG

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Image classification based on sparse-coded features using sparse coding technique for aerial imagery: a hybrid dictionary approach by Qayyum A., Saeed Malik A., Saad N.M., Iqbal M., Abdullah M.F., Rasheed W., Abdullah T.A.B.R., Bin Jafaar M.Y.

Source code classification using latent semantic indexing with structural and frequency term weighting by Yusof, Yuhanis, Alhersh, Taha, Mahmuddin, Massudi, Mohamed Din, Aniza

“…This research proposes a Latent Semantic Indexing classifier that integrates information structural and frequency of terms in its weighting scheme.The content terms are identified by extracting words in the source code program. Based on the undertaken experiment the LSI classifier is noted to generate a higher precision and recall compared to the C4.5 algorithm. …”
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Cross-project software defect prediction by Bala, Yahaya Zakariyau, Abdul Samat, Pathiah, Sharif, Khaironi Yatim, Manshor, Noridayu

“…In this work, five research questions covering the classification algorithms, dataset, independent variables, performance evaluation metrics used in CPDP studies, and as well as the performance of individual machine learning classification algorithms in predicting software defects across different software projects were addressed accordingly. …”
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Scene classification for aerial images based on CNN using sparse coding technique by Qayyum, A., Malik, A.S., Saad, N.M., Iqbal, M., Faris Abdullah, M., Rasheed, W., Rashid Abdullah, T.A., Bin Jafaar, M.Y.

“…Recent developments include several approaches and numerous algorithms address the task. This article proposes a convolutional neural network (CNN) approach that utilizes sparse coding for scene classification applicable for HRRS unmanned aerial vehicle (UAV) and satellite imagery. …”
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Enhancement of bearing defect diagnosis via genetic algorithm optimized feature selection by Chia, Yee Shin

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Content adaptive fast motion estimation based on spatio-temporal homogeneity analysis and motion classification by Nisar, Humaira, Malik, Aamir Saeed, Choi, Tae-Sun

“…In video coding, research is focused on the development of fast motion estimation (ME) algorithms while keeping the coding distortion as small as possible. …”
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Enhanced Image Classification for Defect Detection on Solar Photovoltaic Modules by Wiliani, Ninuk

“…However, high similarity of characteristics among the shapes and textures has been a major challenge in defect classification process. The objective of this research was to develop and analyse feature extraction used for classification techniques for defect detection of solar photovoltaic modules surfaces. …”
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