Search Results - (( defect classification _ algorithm ) OR ( code classification techniques algorithm ))

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  1. 1

    Cross-project software defect prediction by Bala, Yahaya Zakariyau, Abdul Samat, Pathiah, Sharif, Khaironi Yatim, Manshor, Noridayu

    Published 2022
    “…Through this work, it was discovered the majority of the selected studies used machine learning techniques as classification algorithms, and 64% of the studies used the combination of Object-Oriented (OO) and Line of Code (LOC) metrics. …”
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    Article
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    Android Malware classification using static code analysis and Apriori algorithm improved with particle swarm optimization by Adebayo, Olawale Surajudeen, Abdul Aziz, Normaziah

    Published 2014
    “…However, only supervised learning techniques have proofed insufficient for malware classification task. …”
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    Proceeding Paper
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    An improved defect classification algorithm for six printing defects and its implementation on real printed circuit board images by Ibrahim, I., Ibrahim, Z., Khalil, K., Mokji, M.M., Abu Bakar, S.A.R.S., Mokhtar, N., Ahmad, W.K.W.

    Published 2012
    “…The improved PCB defect classification algorithm has been applied to real PCB images to successfully classify all of the defects. …”
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    Article
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    Evaluation of the Transfer Learning Models in Wafer Defects Classification by Jessnor Arif, Mat Jizat, Anwar, P. P. Abdul Majeed, Ahmad Fakhri, Ab. Nasir, Zahari, Taha, Yuen, Edmund, Lim, Shi Xuen

    Published 2022
    “…The key metrics for the evaluation are classification accuracy, classification precision and classification recall. 855 images were used to train and test the algorithms. …”
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    Conference or Workshop Item
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    Using the bees algorithm to optimise a support vector machine for wood defect classification by Pham, D.T, Muhammad, Zaidi, Mahmuddin, Massudi, Ghanbarzadeh, Afshin, Koc, Ebubekir, Otri, Sameh

    Published 2007
    “…The objective of the work was to find the best combination of SVM parameters and data features to maximize defect classification accuracy. The paper presents the results obtained to demonstrate the strengths of the Bees Algorithm as an optimization tool.…”
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    Conference or Workshop Item
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    Software defect prediction framework based on hybrid metaheuristic optimization methods by Wahono, Romi Satria

    Published 2015
    “…The classification algorithm is a popular machine learning approach for software defect prediction. …”
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    Thesis
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    Classification Analysis Of High Frequency Stress Wave For Autonomous Detection Of Defect In Steel Tubes by Abd Halim, Zakiah, Jamaludin, Nordin, Junaidi, Syarif, Syed Yahya, Syed Yusaini

    Published 2014
    “…Interpretation of propagated high frequency stress wave signals in steel tubes is noteworthy for defect identification.This paper demonstrated a successful new approach for autonomous defect detection in steel tubes using classification analysis of high frequency stress waves.Classification analysis using Principal Component Analysis (PCA) algorithm involved feature extraction to reduce the dimensionality of the complex stress waves propagation path.Two defective tubes containing a slot defect of different orientation and a reference tube are inspected using Vibration Impact Acoustic Emission (VIAE) technique.The tubes are externally excited using impact hammer.The variation of stress wave transmission path are captured by high frequency Acoustic Emission sensor.The propagated stress waves in the steel tubes are classified using PCA algorithm.Classification results are graphically illustrated using a dendrogram that demonstrated the arrangement of the natural clusters of the stress wave signals.The inspection of steel tubes showed good recognition of defect in circumferential and longitudinal orientation.This approach successfully classified stress wave signals from VIAE testing and provide fast and accurate defect identification of defective steel tubes from non-defective tubes. …”
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    Article
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    The formulation of a transfer learning pipeline for the classification of the wafer defects by Lim, Shi Xuen

    Published 2023
    “…Automated processes have been used commonly in recent years, with the judgement done by using conventional image processing algorithm. However, limitations such as robustness and difficulty in setting up the parameters required for image processing algorithm encourages the investigation in using Deep learning classification in detecting the wafer defects. …”
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    Thesis
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    Scene classification for aerial images based on CNN using sparse coding technique by Qayyum, A., Malik, A.S., Saad, N.M., Iqbal, M., Faris Abdullah, M., Rasheed, W., Rashid Abdullah, T.A., Bin Jafaar, M.Y.

    Published 2017
    “…Recent developments include several approaches and numerous algorithms address the task. This article proposes a convolutional neural network (CNN) approach that utilizes sparse coding for scene classification applicable for HRRS unmanned aerial vehicle (UAV) and satellite imagery. …”
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    Article
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    Evaluation of the machine learning classifier in wafer defects classification by Jessnor Arif, Mat Jizat, Anwar, P. P. Abdul Majeed, Ahmad Fakhri, Ab. Nasir, Zahari, Taha, Yuen, Edmund

    Published 2021
    “…The key metrics for the evaluation are classification accuracy, classification precision and classification recall. 855 images were used to train, test and validate the classifier. …”
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    Article
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    Neural network paradigm for classification of defects on PCB by Heriansyah, Rudi, Syed Al-Attas, Syed Abdul Rahman, Zabidi, Muhammad Mun'im Ahmad

    Published 2003
    “…The algorithms to segment the image into basic primitive patterns, enclosing the primitive patterns, patterns assignment, patterns normalization, and classification have been developed based on binary morphological image processing and Learning Vector Quantization (LVQ) neural network. …”
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    Article
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    Enhanced Image Classification for Defect Detection on Solar Photovoltaic Modules by Wiliani, Ninuk

    Published 2023
    “…However, high similarity of characteristics among the shapes and textures has been a major challenge in defect classification process. The objective of this research was to develop and analyse feature extraction used for classification techniques for defect detection of solar photovoltaic modules surfaces. …”
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    Thesis
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