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    Detection of Monocrystalline Silicon Wafer Defects Using Deep Transfer Learning

    Detection of Monocrystalline Silicon Wafer Defects Using Deep Transfer Learning by Adriana, Ganum, Dayang Nurfatimah, Awang Iskandar, Phei Chin, Lim, Ahmad Hadinata, Fauzi

    Published 2022
    “…The monocrystalline silicon wafer defect classification technique relying on the DTL-MobileNetV2 model achieved the accuracy rate of 98.99% when evaluated against the testing set. …”
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