High Temperature Testingand Noise Integration of a Buck Converter usingSilicon and Silicon Carbide Diodes.
This project includes comparison of the advantages of enhanced SiC device performance at elevated temperatures over Si devices in a buck type DC/DC converter circuit. Being that elevated temperatures in a circuit have always caused energy losses and deviation in results, the manufacturers of sili...
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| Format: | Final Year Project |
| Language: | en |
| Published: |
Universiti Teknologi Petronas
2004
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| Online Access: | http://utpedia.utp.edu.my/id/eprint/8532/1/2004%20-%20High%20Temperature%20Testing%20and%20Noise%20Integration%20of%20a%20Buck%20Converter%20Using%20Silicon%20and%20Silic.pdf http://utpedia.utp.edu.my/id/eprint/8532/ |
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