ENHANCEMENT OF MARKOV RANDOM FIELD MECHANISM TO ACHIEVE FAULT-TOLERANCE IN NANOSCALE CIRCUIT DESIGN
As the MOSFET dimensions scale down towards nanoscale level, the reliability of circuits based on these devices decreases. Hence, designing reliable systems using these nano-devices is becoming challenging. Therefore, a mechanism has to be devised that can make the nanoscale systems perform relia...
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| Format: | Thesis |
| Language: | en |
| Published: |
2011
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| Online Access: | http://utpedia.utp.edu.my/id/eprint/2862/1/Masters_Thesis-_Jahanzeb_Anwer.pdf http://utpedia.utp.edu.my/id/eprint/2862/ |
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