Handling imbalance visualized pattern dataset for yield prediction
The prediction of the yield outcome in a non close loop manufacturing process can be achieved by visualizing the historical data pattern generated from the inspection machine, transform the data pattern and map it into machine learning algorithm for training, in order to automatically generate...
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| Main Authors: | , |
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| Format: | Book Section |
| Language: | en |
| Published: |
IEEE Computer Society
2008
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| Subjects: | |
| Online Access: | https://repo.uum.edu.my/id/eprint/2858/1/04631657_Megat_Norulazmi_Megat_Mohamed_Noor.pdf https://repo.uum.edu.my/id/eprint/2858/ http://dx.doi.org/10.1109/ITSIM.2008.4631657 |
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