A new class of sequential circuits with acyclic test generation complexity
This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose test generation complexity is equivalent to that of the acyclic sequential circuits. We also present a test generation proce...
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| Format: | Conference or Workshop Item |
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2006
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| Online Access: | http://eprints.utm.my/9169/ http://dx.doi.org/10.1109/ICCD.2006.4380851 |
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| author | Ooi, Chia Yee Fujiwara, Hideo |
| author_facet | Ooi, Chia Yee Fujiwara, Hideo |
| author_sort | Ooi, Chia Yee |
| building | UTM Library |
| collection | Institutional Repository |
| content_provider | Universiti Teknologi Malaysia |
| content_source | UTM Institutional Repository |
| continent | Asia |
| country | Malaysia |
| description | This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose test generation complexity is equivalent to that of the acyclic sequential circuits. We also present a test generation procedure for acyclically testable sequential circuits and elaborate a design-for-test (DFT) method to augment an arbitrary sequential circuit into an acyclically testable sequential circuit. Since the class of acyclically testable sequential circuits is larger than the class of acyclic sequential circuits, the DFT method results in lower area overhead than the partial scan method and still achieves complete fault efficiency. Besides, we show through experiment that the proposed method contributes to lower test application time compared to partial scan method. Moreover, the proposed method allows at-speed testing while the partial scan method does not. |
| format | Conference or Workshop Item |
| id | my.utm.eprints-9169 |
| institution | Universiti Teknologi Malaysia |
| publishDate | 2006 |
| record_format | eprints |
| spelling | my.utm.eprints-91692009-07-27T03:14:22Z http://eprints.utm.my/9169/ A new class of sequential circuits with acyclic test generation complexity Ooi, Chia Yee Fujiwara, Hideo This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose test generation complexity is equivalent to that of the acyclic sequential circuits. We also present a test generation procedure for acyclically testable sequential circuits and elaborate a design-for-test (DFT) method to augment an arbitrary sequential circuit into an acyclically testable sequential circuit. Since the class of acyclically testable sequential circuits is larger than the class of acyclic sequential circuits, the DFT method results in lower area overhead than the partial scan method and still achieves complete fault efficiency. Besides, we show through experiment that the proposed method contributes to lower test application time compared to partial scan method. Moreover, the proposed method allows at-speed testing while the partial scan method does not. 2006 Conference or Workshop Item PeerReviewed Ooi, Chia Yee and Fujiwara, Hideo (2006) A new class of sequential circuits with acyclic test generation complexity. In: 24th IEEE International Conference on Computer Design (ICCD'06), 1-4 Oct. 2007 . http://dx.doi.org/10.1109/ICCD.2006.4380851 |
| spellingShingle | Ooi, Chia Yee Fujiwara, Hideo A new class of sequential circuits with acyclic test generation complexity |
| title | A new class of sequential circuits with acyclic test generation complexity |
| title_full | A new class of sequential circuits with acyclic test generation complexity |
| title_fullStr | A new class of sequential circuits with acyclic test generation complexity |
| title_full_unstemmed | A new class of sequential circuits with acyclic test generation complexity |
| title_short | A new class of sequential circuits with acyclic test generation complexity |
| title_sort | new class of sequential circuits with acyclic test generation complexity |
| url | http://eprints.utm.my/9169/ http://dx.doi.org/10.1109/ICCD.2006.4380851 |
| url_provider | http://eprints.utm.my/ |