Defect detection in thermal image using thresholding technique
This paper proposes a technique to detect defects as depicted in a thermal image. The technique is based on a local neighborhood pixel operation using kernel window 3x3. All pixels within this window will be mapped to only a single pixel value. Next, the thresholding technique is used. The main focu...
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| Format: | Conference or Workshop Item |
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2007
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| Online Access: | http://eprints.utm.my/8630/ |
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| author | Heriansyah, Rudi Syed Abu Bakar, Syed Abdul Rahman |
| author_facet | Heriansyah, Rudi Syed Abu Bakar, Syed Abdul Rahman |
| author_sort | Heriansyah, Rudi |
| building | UTM Library |
| collection | Institutional Repository |
| content_provider | Universiti Teknologi Malaysia |
| content_source | UTM Institutional Repository |
| continent | Asia |
| country | Malaysia |
| description | This paper proposes a technique to detect defects as depicted in a thermal image. The technique is based on a local neighborhood pixel operation using kernel window 3x3. All pixels within this window will be mapped to only a single pixel value. Next, the thresholding technique is used. The main focus of the employed thresholding technique is the popular Otsu method and testing with other global thresholding technique is also given in the text. From the results obtained, it is shown that the proposed method is able to detect defects occur in a thermal image using any standard thresholding technique which is not designed for thermal images. The technique is easy to implement yet the result is promising. |
| format | Conference or Workshop Item |
| id | my.utm.eprints-8630 |
| institution | Universiti Teknologi Malaysia |
| publishDate | 2007 |
| record_format | eprints |
| spelling | my.utm.eprints-86302009-07-27T05:01:21Z http://eprints.utm.my/8630/ Defect detection in thermal image using thresholding technique Heriansyah, Rudi Syed Abu Bakar, Syed Abdul Rahman TK Electrical engineering. Electronics Nuclear engineering This paper proposes a technique to detect defects as depicted in a thermal image. The technique is based on a local neighborhood pixel operation using kernel window 3x3. All pixels within this window will be mapped to only a single pixel value. Next, the thresholding technique is used. The main focus of the employed thresholding technique is the popular Otsu method and testing with other global thresholding technique is also given in the text. From the results obtained, it is shown that the proposed method is able to detect defects occur in a thermal image using any standard thresholding technique which is not designed for thermal images. The technique is easy to implement yet the result is promising. 2007 Conference or Workshop Item PeerReviewed Heriansyah, Rudi and Syed Abu Bakar, Syed Abdul Rahman (2007) Defect detection in thermal image using thresholding technique. In: 6th WSEAS International Conference on Circuits, Systems, Electrnics, Control & Signal Processing (CSECS'07). |
| spellingShingle | TK Electrical engineering. Electronics Nuclear engineering Heriansyah, Rudi Syed Abu Bakar, Syed Abdul Rahman Defect detection in thermal image using thresholding technique |
| title | Defect detection in thermal image using thresholding technique |
| title_full | Defect detection in thermal image using thresholding technique |
| title_fullStr | Defect detection in thermal image using thresholding technique |
| title_full_unstemmed | Defect detection in thermal image using thresholding technique |
| title_short | Defect detection in thermal image using thresholding technique |
| title_sort | defect detection in thermal image using thresholding technique |
| topic | TK Electrical engineering. Electronics Nuclear engineering |
| url | http://eprints.utm.my/8630/ |
| url_provider | http://eprints.utm.my/ |