X-ray diffraction study of evaporated cadmium telluride thin films
X-ray diffraction measurement was performed on evaporated CdTe thin films indicating a preferential orientation in (111) direction. The effect of the deposition rate, thickness and substrate temperature was investigated and the film quality was discussed. It was found that as the deposition rate was...
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | en |
| Published: |
Faculty of Science
2009
|
| Subjects: | |
| Online Access: | http://eprints.utm.my/744/1/BBIsmailDeraman2009_XRayDiffractionStudyofEvaporated.pdf http://eprints.utm.my/744/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1845470336522387456 |
|---|---|
| author | Ismail, Bakar Deraman, Karim Woon, H. Y. |
| author_facet | Ismail, Bakar Deraman, Karim Woon, H. Y. |
| author_sort | Ismail, Bakar |
| building | UTM Library |
| collection | Institutional Repository |
| content_provider | Universiti Teknologi Malaysia |
| content_source | UTM Institutional Repository |
| continent | Asia |
| country | Malaysia |
| description | X-ray diffraction measurement was performed on evaporated CdTe thin films indicating a preferential orientation in (111) direction. The effect of the deposition rate, thickness and substrate temperature was investigated and the film quality was discussed. It was found that as the deposition rate was increased finer crystallite size was obtained, while at the same time the micro-strain decreased. The decrease in crystallite size at higher deposition rate can be interpreted according to the increased velocity and intensity of the vapour atoms during rapid film formation. The crystallite size increased as the substrate temperature was increased up to 200 oC, above which the crystallite size decreased again. As the thickness was increased the micro-strain decreased, while the crystallite size increased with thickness |
| format | Article |
| id | my.utm.eprints-744 |
| institution | Universiti Teknologi Malaysia |
| language | en |
| publishDate | 2009 |
| publisher | Faculty of Science |
| record_format | eprints |
| spelling | my.utm.eprints-7442017-02-08T06:55:01Z http://eprints.utm.my/744/ X-ray diffraction study of evaporated cadmium telluride thin films Ismail, Bakar Deraman, Karim Woon, H. Y. QC Physics X-ray diffraction measurement was performed on evaporated CdTe thin films indicating a preferential orientation in (111) direction. The effect of the deposition rate, thickness and substrate temperature was investigated and the film quality was discussed. It was found that as the deposition rate was increased finer crystallite size was obtained, while at the same time the micro-strain decreased. The decrease in crystallite size at higher deposition rate can be interpreted according to the increased velocity and intensity of the vapour atoms during rapid film formation. The crystallite size increased as the substrate temperature was increased up to 200 oC, above which the crystallite size decreased again. As the thickness was increased the micro-strain decreased, while the crystallite size increased with thickness Faculty of Science 2009 Article PeerReviewed application/pdf en http://eprints.utm.my/744/1/BBIsmailDeraman2009_XRayDiffractionStudyofEvaporated.pdf Ismail, Bakar and Deraman, Karim and Woon, H. Y. (2009) X-ray diffraction study of evaporated cadmium telluride thin films. Jurnal Fizik UTM, 4 . pp. 26-34. ISSN 0128-8644 |
| spellingShingle | QC Physics Ismail, Bakar Deraman, Karim Woon, H. Y. X-ray diffraction study of evaporated cadmium telluride thin films |
| title | X-ray diffraction study of evaporated cadmium telluride thin films |
| title_full | X-ray diffraction study of evaporated cadmium telluride thin films |
| title_fullStr | X-ray diffraction study of evaporated cadmium telluride thin films |
| title_full_unstemmed | X-ray diffraction study of evaporated cadmium telluride thin films |
| title_short | X-ray diffraction study of evaporated cadmium telluride thin films |
| title_sort | x-ray diffraction study of evaporated cadmium telluride thin films |
| topic | QC Physics |
| url | http://eprints.utm.my/744/1/BBIsmailDeraman2009_XRayDiffractionStudyofEvaporated.pdf http://eprints.utm.my/744/ |
| url_provider | http://eprints.utm.my/ |