Electrical conductivity measurements in evaporated tin sulphide thin films
Tin sulphide (SnS) has been evaporated on to substrates maintained at fixed temperature in the range 50-300 oC. X-ray diffraction measurements have shown that the films deposited at the lower substrate temperatures are non-stoichiometric, containing higher sulphides of tin, but that those deposited...
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Taylor & Francis
1994
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| Online Access: | http://eprints.utm.my/2620/1/international_jurnal_of_electronic.pdf http://eprints.utm.my/2620/ |
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| author | Deraman, Karim Sakrani, Samsudi Ismail, B. B. Wahab, Yusof Gould, R. D. |
| author_facet | Deraman, Karim Sakrani, Samsudi Ismail, B. B. Wahab, Yusof Gould, R. D. |
| author_sort | Deraman, Karim |
| building | UTM Library |
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| content_provider | Universiti Teknologi Malaysia |
| content_source | UTM Institutional Repository |
| continent | Asia |
| country | Malaysia |
| description | Tin sulphide (SnS) has been evaporated on to substrates maintained at fixed temperature in the range 50-300 oC. X-ray diffraction measurements have shown that the films deposited at the lower substrate temperatures are non-stoichiometric, containing higher sulphides of tin, but that those deposited at 300 oC consist essentially only of SnS. Film conductivity increased in the range 0.5-2.0 S m-1 as the substrate temperature during deposition increased from 50 oC to 250 oC, this effect being attributed to the changing film composition. Films deposited at 50 oC and 150 oC showed thermally activated conductivity at temperatures above 220-250K, with activation energies Ea of 0.12 eV and 0.14 eV, respectively. At lower temperatures both conductivity and activation energy were considerably lower, consistent with hoping via localized states. The conductivity is modified after prolonged cooling to 160 K, although the mechanism of this process is not understood. |
| format | Article |
| id | my.utm.eprints-2620 |
| institution | Universiti Teknologi Malaysia |
| language | en |
| publishDate | 1994 |
| publisher | Taylor & Francis |
| record_format | eprints |
| spelling | my.utm.eprints-26202017-10-24T00:30:37Z http://eprints.utm.my/2620/ Electrical conductivity measurements in evaporated tin sulphide thin films Deraman, Karim Sakrani, Samsudi Ismail, B. B. Wahab, Yusof Gould, R. D. QC Physics Tin sulphide (SnS) has been evaporated on to substrates maintained at fixed temperature in the range 50-300 oC. X-ray diffraction measurements have shown that the films deposited at the lower substrate temperatures are non-stoichiometric, containing higher sulphides of tin, but that those deposited at 300 oC consist essentially only of SnS. Film conductivity increased in the range 0.5-2.0 S m-1 as the substrate temperature during deposition increased from 50 oC to 250 oC, this effect being attributed to the changing film composition. Films deposited at 50 oC and 150 oC showed thermally activated conductivity at temperatures above 220-250K, with activation energies Ea of 0.12 eV and 0.14 eV, respectively. At lower temperatures both conductivity and activation energy were considerably lower, consistent with hoping via localized states. The conductivity is modified after prolonged cooling to 160 K, although the mechanism of this process is not understood. Taylor & Francis 1994 Article PeerReviewed application/pdf en http://eprints.utm.my/2620/1/international_jurnal_of_electronic.pdf Deraman, Karim and Sakrani, Samsudi and Ismail, B. B. and Wahab, Yusof and Gould, R. D. (1994) Electrical conductivity measurements in evaporated tin sulphide thin films. International Journal of Electronics, 76 (5). pp. 917-922. ISSN 0020-7217 |
| spellingShingle | QC Physics Deraman, Karim Sakrani, Samsudi Ismail, B. B. Wahab, Yusof Gould, R. D. Electrical conductivity measurements in evaporated tin sulphide thin films |
| title | Electrical conductivity measurements in evaporated tin sulphide thin films |
| title_full | Electrical conductivity measurements in evaporated tin sulphide thin films |
| title_fullStr | Electrical conductivity measurements in evaporated tin sulphide thin films |
| title_full_unstemmed | Electrical conductivity measurements in evaporated tin sulphide thin films |
| title_short | Electrical conductivity measurements in evaporated tin sulphide thin films |
| title_sort | electrical conductivity measurements in evaporated tin sulphide thin films |
| topic | QC Physics |
| url | http://eprints.utm.my/2620/1/international_jurnal_of_electronic.pdf http://eprints.utm.my/2620/ |
| url_provider | http://eprints.utm.my/ |