A study on signature analyzer for design for test (DFT)
This paper takes a look at the use of linear feedback shift registers (LFSR's) as test pattern generators (TPG's) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences...
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| Main Authors: | , , , , |
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| Format: | Book Section |
| Language: | en |
| Published: |
IEEE
2004
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| Subjects: | |
| Online Access: | http://eprints.utm.my/1888/1/AbuLimKok2004_StudyOnSignatureAnalyzerForDFT.pdf http://eprints.utm.my/1888/ |
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| _version_ | 1845470565400313856 |
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| author | A'ain, Abu Khari Lim, C. T. Kok, Hong Ng Sheng, Kwang Ng Liew, Eng Yew |
| author_facet | A'ain, Abu Khari Lim, C. T. Kok, Hong Ng Sheng, Kwang Ng Liew, Eng Yew |
| author_sort | A'ain, Abu Khari |
| building | UTM Library |
| collection | Institutional Repository |
| content_provider | Universiti Teknologi Malaysia |
| content_source | UTM Institutional Repository |
| continent | Asia |
| country | Malaysia |
| description | This paper takes a look at the use of
linear feedback shift registers (LFSR's) as test
pattern generators (TPG's) and signature
analyzers for built-in self-test (BIST). We also
propose a method to generate pseudorandom
test patterns. The proposed method can
generate longer sequences of the same set of
test patterns. |
| format | Book Section |
| id | my.utm.eprints-1888 |
| institution | Universiti Teknologi Malaysia |
| language | en |
| publishDate | 2004 |
| publisher | IEEE |
| record_format | eprints |
| spelling | my.utm.eprints-18882011-03-03T06:47:52Z http://eprints.utm.my/1888/ A study on signature analyzer for design for test (DFT) A'ain, Abu Khari Lim, C. T. Kok, Hong Ng Sheng, Kwang Ng Liew, Eng Yew TK Electrical engineering. Electronics Nuclear engineering This paper takes a look at the use of linear feedback shift registers (LFSR's) as test pattern generators (TPG's) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences of the same set of test patterns. IEEE 2004-12-07 Book Section PeerReviewed application/pdf en http://eprints.utm.my/1888/1/AbuLimKok2004_StudyOnSignatureAnalyzerForDFT.pdf A'ain, Abu Khari and Lim, C. T. and Kok, Hong Ng and Sheng, Kwang Ng and Liew, Eng Yew (2004) A study on signature analyzer for design for test (DFT). In: Proceedings 2004 IEEE International Conference on Semiconductor Electronics. IEEE, USA, pp. 138-142. ISBN 0-7803-8658-2 10.1109/SMELEC.2004.1620855 |
| spellingShingle | TK Electrical engineering. Electronics Nuclear engineering A'ain, Abu Khari Lim, C. T. Kok, Hong Ng Sheng, Kwang Ng Liew, Eng Yew A study on signature analyzer for design for test (DFT) |
| title | A study on signature analyzer for design for test (DFT) |
| title_full | A study on signature analyzer for design for test (DFT) |
| title_fullStr | A study on signature analyzer for design for test (DFT) |
| title_full_unstemmed | A study on signature analyzer for design for test (DFT) |
| title_short | A study on signature analyzer for design for test (DFT) |
| title_sort | study on signature analyzer for design for test (dft) |
| topic | TK Electrical engineering. Electronics Nuclear engineering |
| url | http://eprints.utm.my/1888/1/AbuLimKok2004_StudyOnSignatureAnalyzerForDFT.pdf http://eprints.utm.my/1888/ |
| url_provider | http://eprints.utm.my/ |