The failure of integrated circuit: test and analysis
Failure analysis (FA) is an important function in the development and manufacturing of integrated circuits. It provides essential information for troubleshooting a complex device while ensuring reliability of a product. The objective of FA is to identify cause of failure and initiate corrective acti...
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| Format: | Book Section |
| Language: | en |
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Penerbit Uthm
2019
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| Online Access: | http://eprints.uthm.edu.my/3586/1/c%2010%20DONE.pdf http://eprints.uthm.edu.my/3586/ |
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