Ong, K., & SAID, M. R. (2011). A Study on the Deposition of Tin on the Contac ts Subjected to High Frequency Impac t Loading in Semiconductor Device Testing. Penerbit UTeM.
Chicago Style (17th ed.) CitationOng, K.Y, and MD RADZAI SAID. A Study on the Deposition of Tin on The Contac Ts Subjected to High Frequency Impac T Loading in Semiconductor Device Testing. Penerbit UTeM, 2011.
MLA (9th ed.) CitationOng, K.Y, and MD RADZAI SAID. A Study on the Deposition of Tin on The Contac Ts Subjected to High Frequency Impac T Loading in Semiconductor Device Testing. Penerbit UTeM, 2011.
Warning: These citations may not always be 100% accurate.