Omar, G., Tamaldin, N., & Muhamad, M. R. (2000). Correlation of silicon wafer strength to the surface morphology.
Chicago Style (17th ed.) CitationOmar, Ghazali, Noreffendy Tamaldin, and M. Rasat Muhamad. Correlation of Silicon Wafer Strength to the Surface Morphology. 2000.
MLA (9th ed.) CitationOmar, Ghazali, et al. Correlation of Silicon Wafer Strength to the Surface Morphology. 2000.
Warning: These citations may not always be 100% accurate.
