A Review Paper On Memory Fault Models And Test Algorithms
Testing embedded memories in a chip can be very challenging due to their high-density nature and manufactured using very deep submicron (VDSM) technologies. In this review paper, functional fault models which may exist in the memory are described, in terms of their definition and detection requireme...
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Institute of Advanced Engineering and Science
2021
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| Online Access: | http://eprints.utem.edu.my/id/eprint/25762/2/2021_A%20REVIEW%20PAPER%20ON%20MEMORY%20FAULT%20MODELS%20AND%20TEST%20ALGORITHMS.PDF http://eprints.utem.edu.my/id/eprint/25762/ https://www.beei.org/index.php/EEI/article/view/3048/2409 |
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| author | Hussin, Razaidi Jidin, Aiman Zakwan Lee, Weng Fook Mispan, Mohd Syafiq |
| author_facet | Hussin, Razaidi Jidin, Aiman Zakwan Lee, Weng Fook Mispan, Mohd Syafiq |
| author_sort | Hussin, Razaidi |
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| content_provider | Universiti Teknikal Malaysia Melaka |
| content_source | UTEM Institutional Repository |
| continent | Asia |
| country | Malaysia |
| description | Testing embedded memories in a chip can be very challenging due to their high-density nature and manufactured using very deep submicron (VDSM) technologies. In this review paper, functional fault models which may exist in the memory are described, in terms of their definition and detection requirement. Several memory testing algorithms that are used in memory built-in self-test (BIST) are discussed, in terms of test operation sequences, fault detection ability, and also test complexity. From the studies, it shows that tests with 22 N of complexity such as March SS and March AB are needed to detect all static unlinked or simple faults within the memory cells. The N in the algorithm complexity refers to Nx*Ny*Nz whereby Nx represents the number of rows, Ny represents the number of columns and Nz represents the number of banks. This paper also looks into optimization and further improvement that can be achieved on existing March test algorithms to increase the fault coverage or to reduce the test complexity. |
| format | Article |
| id | my.utem.eprints-25762 |
| institution | Universiti Teknikal Malaysia Melaka |
| language | en |
| publishDate | 2021 |
| publisher | Institute of Advanced Engineering and Science |
| record_format | eprints |
| spelling | my.utem.eprints-257622022-03-16T16:19:25Z http://eprints.utem.edu.my/id/eprint/25762/ A Review Paper On Memory Fault Models And Test Algorithms Hussin, Razaidi Jidin, Aiman Zakwan Lee, Weng Fook Mispan, Mohd Syafiq Testing embedded memories in a chip can be very challenging due to their high-density nature and manufactured using very deep submicron (VDSM) technologies. In this review paper, functional fault models which may exist in the memory are described, in terms of their definition and detection requirement. Several memory testing algorithms that are used in memory built-in self-test (BIST) are discussed, in terms of test operation sequences, fault detection ability, and also test complexity. From the studies, it shows that tests with 22 N of complexity such as March SS and March AB are needed to detect all static unlinked or simple faults within the memory cells. The N in the algorithm complexity refers to Nx*Ny*Nz whereby Nx represents the number of rows, Ny represents the number of columns and Nz represents the number of banks. This paper also looks into optimization and further improvement that can be achieved on existing March test algorithms to increase the fault coverage or to reduce the test complexity. Institute of Advanced Engineering and Science 2021-12 Article PeerReviewed text en http://eprints.utem.edu.my/id/eprint/25762/2/2021_A%20REVIEW%20PAPER%20ON%20MEMORY%20FAULT%20MODELS%20AND%20TEST%20ALGORITHMS.PDF Hussin, Razaidi and Jidin, Aiman Zakwan and Lee, Weng Fook and Mispan, Mohd Syafiq (2021) A Review Paper On Memory Fault Models And Test Algorithms. Bulletin Of Electrical Engineering And Informatics, 10 (6). pp. 3083-3093. ISSN 2089-3191 https://www.beei.org/index.php/EEI/article/view/3048/2409 10.11591/eei.v10i6.3048 |
| spellingShingle | Hussin, Razaidi Jidin, Aiman Zakwan Lee, Weng Fook Mispan, Mohd Syafiq A Review Paper On Memory Fault Models And Test Algorithms |
| title | A Review Paper On Memory Fault Models And Test Algorithms |
| title_full | A Review Paper On Memory Fault Models And Test Algorithms |
| title_fullStr | A Review Paper On Memory Fault Models And Test Algorithms |
| title_full_unstemmed | A Review Paper On Memory Fault Models And Test Algorithms |
| title_short | A Review Paper On Memory Fault Models And Test Algorithms |
| title_sort | review paper on memory fault models and test algorithms |
| url | http://eprints.utem.edu.my/id/eprint/25762/2/2021_A%20REVIEW%20PAPER%20ON%20MEMORY%20FAULT%20MODELS%20AND%20TEST%20ALGORITHMS.PDF http://eprints.utem.edu.my/id/eprint/25762/ https://www.beei.org/index.php/EEI/article/view/3048/2409 |
| url_provider | http://eprints.utem.edu.my/ |