NANOSTRUCTURAL STUDIES OF SPUTTER-DEPOSITED NixAl1-x (0.5 ≤ x ≤ 1.0) ALLOY THIN FILMS
The nanostructural characteristics of direct-current magnetron sputter-deposited NixAl1-x (0.5 ≤ x ≤ 1.0) alloy films were studied during in situ isothermal annealing in a transmission electron microscope. An expansion of the lattice by nearly 5% was observed for the Ni0.5Al0.5 and the Ni0.8Al0.2 fi...
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | en |
| Published: |
Universiti Putra Malaysia
2011
|
| Subjects: | |
| Online Access: | http://eprints.utem.edu.my/id/eprint/10139/1/MJM_7.pdf http://eprints.utem.edu.my/id/eprint/10139/ http://www.myjurnal.my/public/browse-journal-view.php?id=103 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1832716453975949312 |
|---|---|
| author | T., Joseph Sahaya Anand A., H.W. Ngan |
| author_facet | T., Joseph Sahaya Anand A., H.W. Ngan |
| author_sort | T., Joseph Sahaya Anand |
| building | UTEM Library |
| collection | Institutional Repository |
| content_provider | Universiti Teknikal Malaysia Melaka |
| content_source | UTEM Institutional Repository |
| continent | Asia |
| country | Malaysia |
| description | The nanostructural characteristics of direct-current magnetron sputter-deposited NixAl1-x (0.5 ≤ x ≤ 1.0) alloy films were studied during in situ isothermal annealing in a transmission electron microscope. An expansion of the lattice by nearly 5% was observed for the Ni0.5Al0.5 and the Ni0.8Al0.2 films in their low-thickness and as-deposited state. The lattice size approaches the bulk value when the film thickness increases or after vacuum annealing heat-treatment. The Ni0.8Al0.2 films have a nanocrystalline structure in which the ordered L12 phase appears upon annealing at above 500°C. The ordered B2 phase for Ni0.5Al0.5 and Ni5Al3 phase with orthorhombic structure for Ni0.65Al0.35 were found. |
| format | Article |
| id | my.utem.eprints-10139 |
| institution | Universiti Teknikal Malaysia Melaka |
| language | en |
| publishDate | 2011 |
| publisher | Universiti Putra Malaysia |
| record_format | eprints |
| spelling | my.utem.eprints-101392015-05-28T04:09:20Z http://eprints.utem.edu.my/id/eprint/10139/ NANOSTRUCTURAL STUDIES OF SPUTTER-DEPOSITED NixAl1-x (0.5 ≤ x ≤ 1.0) ALLOY THIN FILMS T., Joseph Sahaya Anand A., H.W. Ngan TJ Mechanical engineering and machinery The nanostructural characteristics of direct-current magnetron sputter-deposited NixAl1-x (0.5 ≤ x ≤ 1.0) alloy films were studied during in situ isothermal annealing in a transmission electron microscope. An expansion of the lattice by nearly 5% was observed for the Ni0.5Al0.5 and the Ni0.8Al0.2 films in their low-thickness and as-deposited state. The lattice size approaches the bulk value when the film thickness increases or after vacuum annealing heat-treatment. The Ni0.8Al0.2 films have a nanocrystalline structure in which the ordered L12 phase appears upon annealing at above 500°C. The ordered B2 phase for Ni0.5Al0.5 and Ni5Al3 phase with orthorhombic structure for Ni0.65Al0.35 were found. Universiti Putra Malaysia 2011 Article PeerReviewed application/pdf en http://eprints.utem.edu.my/id/eprint/10139/1/MJM_7.pdf T., Joseph Sahaya Anand and A., H.W. Ngan (2011) NANOSTRUCTURAL STUDIES OF SPUTTER-DEPOSITED NixAl1-x (0.5 ≤ x ≤ 1.0) ALLOY THIN FILMS. Malaysian Journal of Microscopy, 7. pp. 221-227. ISSN 1823 7010 http://www.myjurnal.my/public/browse-journal-view.php?id=103 |
| spellingShingle | TJ Mechanical engineering and machinery T., Joseph Sahaya Anand A., H.W. Ngan NANOSTRUCTURAL STUDIES OF SPUTTER-DEPOSITED NixAl1-x (0.5 ≤ x ≤ 1.0) ALLOY THIN FILMS |
| title | NANOSTRUCTURAL STUDIES OF SPUTTER-DEPOSITED NixAl1-x (0.5 ≤ x ≤ 1.0) ALLOY THIN FILMS |
| title_full | NANOSTRUCTURAL STUDIES OF SPUTTER-DEPOSITED NixAl1-x (0.5 ≤ x ≤ 1.0) ALLOY THIN FILMS |
| title_fullStr | NANOSTRUCTURAL STUDIES OF SPUTTER-DEPOSITED NixAl1-x (0.5 ≤ x ≤ 1.0) ALLOY THIN FILMS |
| title_full_unstemmed | NANOSTRUCTURAL STUDIES OF SPUTTER-DEPOSITED NixAl1-x (0.5 ≤ x ≤ 1.0) ALLOY THIN FILMS |
| title_short | NANOSTRUCTURAL STUDIES OF SPUTTER-DEPOSITED NixAl1-x (0.5 ≤ x ≤ 1.0) ALLOY THIN FILMS |
| title_sort | nanostructural studies of sputter-deposited nixal1-x (0.5 ≤ x ≤ 1.0) alloy thin films |
| topic | TJ Mechanical engineering and machinery |
| url | http://eprints.utem.edu.my/id/eprint/10139/1/MJM_7.pdf http://eprints.utem.edu.my/id/eprint/10139/ http://www.myjurnal.my/public/browse-journal-view.php?id=103 |
| url_provider | http://eprints.utem.edu.my/ |