X-Ray Diffraction Analysis Of Gallium Oxide Thin Films Synthesized By A Simple And Cost-Effective Method
Wide energy gap beta type gallium oxide (Ga2O3) semiconductor material has attracted many researchers’ interests due its thermal and chemical stability. For synthesising Ga2O3 thin films, sol-gel spin coating is a simple and cost-efficient method, especially for spin coating on cheap substrate such...
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Conference or Workshop Item |
| Language: | en |
| Published: |
2020
|
| Subjects: | |
| Online Access: | http://eprints.usm.my/49093/1/ABSTRACT%20BOOK%20MNRG%202020.pdf%20cut%2073.pdf http://eprints.usm.my/49093/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1834504292185145344 |
|---|---|
| author | Tiankun, Wang Ng, Sha Shiong |
| author_facet | Tiankun, Wang Ng, Sha Shiong |
| author_sort | Tiankun, Wang |
| building | Hamzah Sendut Library |
| collection | Institutional Repository |
| content_provider | Universiti Sains Malaysia |
| content_source | USM Institutional Repository |
| continent | Asia |
| country | Malaysia |
| description | Wide energy gap beta type gallium oxide (Ga2O3) semiconductor material has attracted many researchers’ interests due its thermal and chemical stability. For
synthesising Ga2O3 thin films, sol-gel spin coating is a simple and cost-efficient method, especially for spin coating on cheap substrate such as silicon (Si) substrate. However, little is known about the spin coating growth of the Ga2O3 thin films on Si substrate. In this paper, special attention was paid to the pre-treatment of the Si substrate and the coated layer prior
and post spin coating because the uniformity and the quality of the synthesized films are strongly affected by the surface conditions of the substrate/layer. To access the structural and crystallite quality of the deposited Ga2O3, X-ray diffraction measurements were carried out
and in-depth analyses using Williamson-Hall and size-strain plots methods were performed. The results show that the crystallite size of the spin coated Ga2O3 on Si is not influenced by the micro strain. |
| format | Conference or Workshop Item |
| id | my.usm.eprints.49093 |
| institution | Universiti Sains Malaysia |
| language | en |
| publishDate | 2020 |
| record_format | eprints |
| spelling | my.usm.eprints.49093 http://eprints.usm.my/49093/ X-Ray Diffraction Analysis Of Gallium Oxide Thin Films Synthesized By A Simple And Cost-Effective Method Tiankun, Wang Ng, Sha Shiong QC1-999 Physics Wide energy gap beta type gallium oxide (Ga2O3) semiconductor material has attracted many researchers’ interests due its thermal and chemical stability. For synthesising Ga2O3 thin films, sol-gel spin coating is a simple and cost-efficient method, especially for spin coating on cheap substrate such as silicon (Si) substrate. However, little is known about the spin coating growth of the Ga2O3 thin films on Si substrate. In this paper, special attention was paid to the pre-treatment of the Si substrate and the coated layer prior and post spin coating because the uniformity and the quality of the synthesized films are strongly affected by the surface conditions of the substrate/layer. To access the structural and crystallite quality of the deposited Ga2O3, X-ray diffraction measurements were carried out and in-depth analyses using Williamson-Hall and size-strain plots methods were performed. The results show that the crystallite size of the spin coated Ga2O3 on Si is not influenced by the micro strain. 2020-12-02 Conference or Workshop Item PeerReviewed application/pdf en http://eprints.usm.my/49093/1/ABSTRACT%20BOOK%20MNRG%202020.pdf%20cut%2073.pdf Tiankun, Wang and Ng, Sha Shiong (2020) X-Ray Diffraction Analysis Of Gallium Oxide Thin Films Synthesized By A Simple And Cost-Effective Method. In: 5th Meeting of Malaysia Nitrides Research Group (MNRG 2020), 1-2 December 2020. |
| spellingShingle | QC1-999 Physics Tiankun, Wang Ng, Sha Shiong X-Ray Diffraction Analysis Of Gallium Oxide Thin Films Synthesized By A Simple And Cost-Effective Method |
| title | X-Ray Diffraction Analysis Of Gallium Oxide Thin Films Synthesized By A Simple And Cost-Effective Method |
| title_full | X-Ray Diffraction Analysis Of Gallium Oxide Thin Films Synthesized By A Simple And Cost-Effective Method |
| title_fullStr | X-Ray Diffraction Analysis Of Gallium Oxide Thin Films Synthesized By A Simple And Cost-Effective Method |
| title_full_unstemmed | X-Ray Diffraction Analysis Of Gallium Oxide Thin Films Synthesized By A Simple And Cost-Effective Method |
| title_short | X-Ray Diffraction Analysis Of Gallium Oxide Thin Films Synthesized By A Simple And Cost-Effective Method |
| title_sort | x-ray diffraction analysis of gallium oxide thin films synthesized by a simple and cost-effective method |
| topic | QC1-999 Physics |
| url | http://eprints.usm.my/49093/1/ABSTRACT%20BOOK%20MNRG%202020.pdf%20cut%2073.pdf http://eprints.usm.my/49093/ |
| url_provider | http://eprints.usm.my/ |