Characteristics Of InGaN Based Red Led Epiwafer

This paper describes a preliminary work of developing InGaN based red LED using two-flow MOCVD reactor, focussing on characteristics of the LED epiwafer from the aspects of optics, surface and crystalline structure. The active region multiquantum wells (MQWs) of the LED consists of In0.3Ga0.7N quant...

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Main Authors: Zainal, N., Alhassan, Abdullah I., Nakamura, S., Denbaars, S. P., Speck, J. S.
Format: Conference or Workshop Item
Language:en
Published: 2019
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Online Access:http://eprints.usm.my/48868/1/ICoSeMT%202019%20ABSTRACT%20BOOK%20145.pdf
http://eprints.usm.my/48868/
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_version_ 1834504234254467072
author Zainal, N.
Alhassan, Abdullah I.
Nakamura, S.
Denbaars, S. P.
Speck, J. S.
author_facet Zainal, N.
Alhassan, Abdullah I.
Nakamura, S.
Denbaars, S. P.
Speck, J. S.
author_sort Zainal, N.
building Hamzah Sendut Library
collection Institutional Repository
content_provider Universiti Sains Malaysia
content_source USM Institutional Repository
continent Asia
country Malaysia
description This paper describes a preliminary work of developing InGaN based red LED using two-flow MOCVD reactor, focussing on characteristics of the LED epiwafer from the aspects of optics, surface and crystalline structure. The active region multiquantum wells (MQWs) of the LED consists of In0.3Ga0.7N quantum well and GaN quantum barrier, which were alternatively grown for a period of 4 with Al0.28Ga0.72N as a cap layer between the quantum well and the quantum barrier. From EL measurement, the LED showed a broad emission peak at 615 nm. The broad emission can be related to the presence of hexagonal pits on the LED’s surface, as witnessed through SEM and AFM measurements. Despite of that, XRD measurement implied the LED has a relatively good crystalline structure with FWHM of ~234 arcsec in (002) and (102) scans. XRD-RSM measurement suggests that the MQWs are under strain. On the basis of this work, further effort on reducing the hexagonal pits is required to improve the characteristics of the LED epiwafer so that it is useful to be processed into functional devices.
format Conference or Workshop Item
id my.usm.eprints.48868
institution Universiti Sains Malaysia
language en
publishDate 2019
record_format eprints
spelling my.usm.eprints.48868 http://eprints.usm.my/48868/ Characteristics Of InGaN Based Red Led Epiwafer Zainal, N. Alhassan, Abdullah I. Nakamura, S. Denbaars, S. P. Speck, J. S. QC1-999 Physics This paper describes a preliminary work of developing InGaN based red LED using two-flow MOCVD reactor, focussing on characteristics of the LED epiwafer from the aspects of optics, surface and crystalline structure. The active region multiquantum wells (MQWs) of the LED consists of In0.3Ga0.7N quantum well and GaN quantum barrier, which were alternatively grown for a period of 4 with Al0.28Ga0.72N as a cap layer between the quantum well and the quantum barrier. From EL measurement, the LED showed a broad emission peak at 615 nm. The broad emission can be related to the presence of hexagonal pits on the LED’s surface, as witnessed through SEM and AFM measurements. Despite of that, XRD measurement implied the LED has a relatively good crystalline structure with FWHM of ~234 arcsec in (002) and (102) scans. XRD-RSM measurement suggests that the MQWs are under strain. On the basis of this work, further effort on reducing the hexagonal pits is required to improve the characteristics of the LED epiwafer so that it is useful to be processed into functional devices. 2019-04-30 Conference or Workshop Item PeerReviewed application/pdf en http://eprints.usm.my/48868/1/ICoSeMT%202019%20ABSTRACT%20BOOK%20145.pdf Zainal, N. and Alhassan, Abdullah I. and Nakamura, S. and Denbaars, S. P. and Speck, J. S. (2019) Characteristics Of InGaN Based Red Led Epiwafer. In: International Conference On Semiconductor Materials Technology.
spellingShingle QC1-999 Physics
Zainal, N.
Alhassan, Abdullah I.
Nakamura, S.
Denbaars, S. P.
Speck, J. S.
Characteristics Of InGaN Based Red Led Epiwafer
title Characteristics Of InGaN Based Red Led Epiwafer
title_full Characteristics Of InGaN Based Red Led Epiwafer
title_fullStr Characteristics Of InGaN Based Red Led Epiwafer
title_full_unstemmed Characteristics Of InGaN Based Red Led Epiwafer
title_short Characteristics Of InGaN Based Red Led Epiwafer
title_sort characteristics of ingan based red led epiwafer
topic QC1-999 Physics
url http://eprints.usm.my/48868/1/ICoSeMT%202019%20ABSTRACT%20BOOK%20145.pdf
http://eprints.usm.my/48868/
url_provider http://eprints.usm.my/