Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0

Simultaneous Switching Noise (SSN) is increasing with higher I/O data rate, resulting into challenges for regulating supply voltage in typical transistor circuit. Supply voltage changes accordingly with Power Distribution Network (PDN) design. Engineering efforts are focused on PDN layout to minimiz...

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Main Author: Chan, Siang Rui
Format: Thesis
Language:en
Published: 2013
Subjects:
Online Access:http://eprints.usm.my/43268/1/Chan%20Siang%20Rui24.pdf
http://eprints.usm.my/43268/
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author Chan, Siang Rui
author_facet Chan, Siang Rui
author_sort Chan, Siang Rui
building Hamzah Sendut Library
collection Institutional Repository
content_provider Universiti Sains Malaysia
content_source USM Institutional Repository
continent Asia
country Malaysia
description Simultaneous Switching Noise (SSN) is increasing with higher I/O data rate, resulting into challenges for regulating supply voltage in typical transistor circuit. Supply voltage changes accordingly with Power Distribution Network (PDN) design. Engineering efforts are focused on PDN layout to minimize the impedance path. However, the desire to miniaturize components on a system increases design challenges to control voltage drop via comprehensive PDN design. Hence, it is a need to study the impact of supply noise to signal performance in future PDN design. Instead of optimizing PDN, a different way of quantifying different frequency supply voltage impact to output signal is introduced in this research. In order to observe this relationship, Universal Serial Bus (USB) transmitter circuit signal performance is explored. Signal eye diagram is observed by replacing DC input voltage with various frequencies of AC input voltage. From the simulation, USB transmitter has better immunity to the supply noise at its operating frequency of 480 MHz, and also its harmonic frequencies of 960 MHz and 1.44 GHz. Excessive amount of supply noises at these frequencies are not causing signal eye diagram to fail. This finding is further verified by lab measurement. Eye diagram is measured by different simultaneous switching stress test cases. The supply voltage is captured and analyzed using Fast Fourier Transform (FFT) to identify the major frequency contributors in the noise profile. From the measurement result, signal has better performance especially when the measured supply noise falls in the frequency regions of 480 MHz and 960 MHz.
format Thesis
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institution Universiti Sains Malaysia
language en
publishDate 2013
record_format eprints
spelling my.usm.eprints.43268 http://eprints.usm.my/43268/ Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0 Chan, Siang Rui TK1-9971 Electrical engineering. Electronics. Nuclear engineering Simultaneous Switching Noise (SSN) is increasing with higher I/O data rate, resulting into challenges for regulating supply voltage in typical transistor circuit. Supply voltage changes accordingly with Power Distribution Network (PDN) design. Engineering efforts are focused on PDN layout to minimize the impedance path. However, the desire to miniaturize components on a system increases design challenges to control voltage drop via comprehensive PDN design. Hence, it is a need to study the impact of supply noise to signal performance in future PDN design. Instead of optimizing PDN, a different way of quantifying different frequency supply voltage impact to output signal is introduced in this research. In order to observe this relationship, Universal Serial Bus (USB) transmitter circuit signal performance is explored. Signal eye diagram is observed by replacing DC input voltage with various frequencies of AC input voltage. From the simulation, USB transmitter has better immunity to the supply noise at its operating frequency of 480 MHz, and also its harmonic frequencies of 960 MHz and 1.44 GHz. Excessive amount of supply noises at these frequencies are not causing signal eye diagram to fail. This finding is further verified by lab measurement. Eye diagram is measured by different simultaneous switching stress test cases. The supply voltage is captured and analyzed using Fast Fourier Transform (FFT) to identify the major frequency contributors in the noise profile. From the measurement result, signal has better performance especially when the measured supply noise falls in the frequency regions of 480 MHz and 960 MHz. 2013-06 Thesis NonPeerReviewed application/pdf en http://eprints.usm.my/43268/1/Chan%20Siang%20Rui24.pdf Chan, Siang Rui (2013) Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0. Masters thesis, Universiti Sains Malaysia.
spellingShingle TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Chan, Siang Rui
Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0
title Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0
title_full Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0
title_fullStr Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0
title_full_unstemmed Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0
title_short Simultaneous Switching Noise Impact To Signal Sensitivity On Usb 2.0
title_sort simultaneous switching noise impact to signal sensitivity on usb 2.0
topic TK1-9971 Electrical engineering. Electronics. Nuclear engineering
url http://eprints.usm.my/43268/1/Chan%20Siang%20Rui24.pdf
http://eprints.usm.my/43268/
url_provider http://eprints.usm.my/