Development Of An Automated Compilation Test System For Embedded System Testing

In the embedded system testing which involved the integration testing between both software and hardware, it becomes increasingly difficult to evaluate the functionality of each functional modules in a short time due to the increasing number of testing required. This research proposed an automated c...

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Main Author: Ooi , Jun Hwan
Format: Thesis
Language:en
Published: 2016
Subjects:
Online Access:http://eprints.usm.my/41301/1/Ooi_Jun_Hwan_24_Pages.pdf
http://eprints.usm.my/41301/
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author Ooi , Jun Hwan
author_facet Ooi , Jun Hwan
author_sort Ooi , Jun Hwan
building Hamzah Sendut Library
collection Institutional Repository
content_provider Universiti Sains Malaysia
content_source USM Institutional Repository
continent Asia
country Malaysia
description In the embedded system testing which involved the integration testing between both software and hardware, it becomes increasingly difficult to evaluate the functionality of each functional modules in a short time due to the increasing number of testing required. This research proposed an automated compilation test system through a design structure to improve the quality of testing and optimize the testing time using automation. In other words, the testing coverage can be maximized with minimum manual work and testing time required. This test system has been used to automate the test code compilation and execution for different hardware module testing. The result analysis from the implementation of proposed test system proved that there is a significant testing time saving for around 56.42% besides ensuring the performance and quality of the result. In summary, this research has proposed an automated compilation test system which contributes in time saving and quality assurance for test code compilation and execution process.
format Thesis
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institution Universiti Sains Malaysia
language en
publishDate 2016
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spelling my.usm.eprints.41301 http://eprints.usm.my/41301/ Development Of An Automated Compilation Test System For Embedded System Testing Ooi , Jun Hwan TK7800-8360 Electronics In the embedded system testing which involved the integration testing between both software and hardware, it becomes increasingly difficult to evaluate the functionality of each functional modules in a short time due to the increasing number of testing required. This research proposed an automated compilation test system through a design structure to improve the quality of testing and optimize the testing time using automation. In other words, the testing coverage can be maximized with minimum manual work and testing time required. This test system has been used to automate the test code compilation and execution for different hardware module testing. The result analysis from the implementation of proposed test system proved that there is a significant testing time saving for around 56.42% besides ensuring the performance and quality of the result. In summary, this research has proposed an automated compilation test system which contributes in time saving and quality assurance for test code compilation and execution process. 2016 Thesis NonPeerReviewed application/pdf en http://eprints.usm.my/41301/1/Ooi_Jun_Hwan_24_Pages.pdf Ooi , Jun Hwan (2016) Development Of An Automated Compilation Test System For Embedded System Testing. Masters thesis, Universiti Sains Malaysia.
spellingShingle TK7800-8360 Electronics
Ooi , Jun Hwan
Development Of An Automated Compilation Test System For Embedded System Testing
title Development Of An Automated Compilation Test System For Embedded System Testing
title_full Development Of An Automated Compilation Test System For Embedded System Testing
title_fullStr Development Of An Automated Compilation Test System For Embedded System Testing
title_full_unstemmed Development Of An Automated Compilation Test System For Embedded System Testing
title_short Development Of An Automated Compilation Test System For Embedded System Testing
title_sort development of an automated compilation test system for embedded system testing
topic TK7800-8360 Electronics
url http://eprints.usm.my/41301/1/Ooi_Jun_Hwan_24_Pages.pdf
http://eprints.usm.my/41301/
url_provider http://eprints.usm.my/