Optical measurements on tailored zinc oxide thin films under optimal

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Bibliographic Details
Main Authors:	R. Haarindraprasad, U. Hashim, Subash C.B. Gopinath, P. Veeradasan, Wei-Wen Liu, B. Sharma Rao, V. Thivina
Format:	journal::journal article
Language:	en
Published:	Elsevier 2024
Subjects:	ZnO Thin film XRD UV – vis Grain size Band gap
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