APA (7th ed.) Citation

I.D, S., N.H, N. A., A.M, A., A, D., T.M, K., M, A. T. M. Y., & 58221414300. (2024). Influence of Deep Trap Density and Injection Barrier Height towards Accumulation of Space Charge within Dielectrics. Institute of Electrical and Electronics Engineers Inc.

Chicago Style (17th ed.) Citation

I.D, Salim, Nik Ali N.H, Ariffin A.M, Doolgindachbaporn A, Kuan T.M, Abdul Talib Mat Yusoh M, and 58221414300. Influence of Deep Trap Density and Injection Barrier Height Towards Accumulation of Space Charge Within Dielectrics. Institute of Electrical and Electronics Engineers Inc, 2024.

MLA (9th ed.) Citation

I.D, Salim, et al. Influence of Deep Trap Density and Injection Barrier Height Towards Accumulation of Space Charge Within Dielectrics. Institute of Electrical and Electronics Engineers Inc, 2024.