APA (7th ed.) Citation

F, S., I, A., F.A, H., A, Z., & 36239165300. (2023). Impact of HALO structure on threshold voltage and leakage current in 45nm NMOS device.

Chicago Style (17th ed.) Citation

F, Salehuddin, Ahmad I, Hamid F.A, Zaharim A, and 36239165300. Impact of HALO Structure on Threshold Voltage and Leakage Current in 45nm NMOS Device. 2023.

MLA (9th ed.) Citation

F, Salehuddin, et al. Impact of HALO Structure on Threshold Voltage and Leakage Current in 45nm NMOS Device. 2023.