APA (7th ed.) Citation

Adriana, G., Dayang Nurfatimah, A. I., Phei Chin, L., & Ahmad Hadinata, F. (2022). Detection of Monocrystalline Silicon Wafer Defects Using Deep Transfer Learning. Journal of Telecommunications and Information Technology.

Chicago Style (17th ed.) Citation

Adriana, Ganum, Awang Iskandar Dayang Nurfatimah, Lim Phei Chin, and Fauzi Ahmad Hadinata. Detection of Monocrystalline Silicon Wafer Defects Using Deep Transfer Learning. Journal of Telecommunications and Information Technology, 2022.

MLA (9th ed.) Citation

Adriana, Ganum, et al. Detection of Monocrystalline Silicon Wafer Defects Using Deep Transfer Learning. Journal of Telecommunications and Information Technology, 2022.