APA (7th ed.) Citation

Mamun, I. R., Lee, W. F., Hamid, N. H., Lo, H. H., & Ali Yeon, M. S. (2010). High degree of testability using full scan chain and ATPG-An industrial perspective. Asian Network for Scientific Information.

Chicago Style (17th ed.) Citation

Mamun, Ibne Reaz, W. F. Lee, N. H. Hamid, H. H. Lo, and Mohd Shakaff Ali Yeon. High Degree of Testability Using Full Scan Chain and ATPG-An Industrial Perspective. Asian Network for Scientific Information, 2010.

MLA (9th ed.) Citation

Mamun, Ibne Reaz, et al. High Degree of Testability Using Full Scan Chain and ATPG-An Industrial Perspective. Asian Network for Scientific Information, 2010.