APA (7th ed.) Citation

C. G., C., S. S., N., Z., H., H., A. H., & cgching17@yahoo.com. (2010). Structural properties studies of GaN on 6H-SiC by means of X-ray diffraction technique. Universiti Malaysia Perlis.

Chicago Style (17th ed.) Citation

C. G., Ching, Ng S. S., Hassan Z., Abu Hassan H., and cgching17@yahoo.com. Structural Properties Studies of GaN on 6H-SiC by Means of X-ray Diffraction Technique. Universiti Malaysia Perlis, 2010.

MLA (9th ed.) Citation

C. G., Ching, et al. Structural Properties Studies of GaN on 6H-SiC by Means of X-ray Diffraction Technique. Universiti Malaysia Perlis, 2010.