Zulkifli, H., Abdul Hallis, A. A., R. Badlishah, A., & zulhusin@unimap.edu.my. (2009). Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties. Institute of Electrical and Electronics Engineering (IEEE).
Chicago Style (17th ed.) CitationZulkifli, Husin, Abdul Aziz Abdul Hallis, Ahmad R. Badlishah, and zulhusin@unimap.edu.my. Feasibility Study of a Non-destructive Fruit Maturity Testing System on Banana Utilizing Capacitive Properties. Institute of Electrical and Electronics Engineering (IEEE), 2009.
MLA (9th ed.) CitationZulkifli, Husin, et al. Feasibility Study of a Non-destructive Fruit Maturity Testing System on Banana Utilizing Capacitive Properties. Institute of Electrical and Electronics Engineering (IEEE), 2009.
