Normah, A., Uda, H., Mohd Jeffrey, M., & Kader Ibrahim, A. W. (2009). Alignment mark architecture effect on alignment signal behavior in advanced lithography. Institute of Electrical and Electronics Engineering (IEEE).
Chicago Style (17th ed.) CitationNormah, Ahmad, Hashim Uda, Manaf Mohd Jeffrey, and Abdul Wahab Kader Ibrahim. Alignment Mark Architecture Effect on Alignment Signal Behavior in Advanced Lithography. Institute of Electrical and Electronics Engineering (IEEE), 2009.
MLA (9th ed.) CitationNormah, Ahmad, et al. Alignment Mark Architecture Effect on Alignment Signal Behavior in Advanced Lithography. Institute of Electrical and Electronics Engineering (IEEE), 2009.
Warning: These citations may not always be 100% accurate.
