Mohd Khairuddin, M. A., Azman, J., & Ibrahim, A. (2008). Characterization of parasitic residual deposition on passivation layer in electronics nickel immersion gold process. Elsevier Science.
Chicago Style (17th ed.) CitationMohd Khairuddin, Md Arshad, Jalar Azman, and Ahmad Ibrahim. Characterization of Parasitic Residual Deposition on Passivation Layer in Electronics Nickel Immersion Gold Process. Elsevier Science, 2008.
MLA (9th ed.) CitationMohd Khairuddin, Md Arshad, et al. Characterization of Parasitic Residual Deposition on Passivation Layer in Electronics Nickel Immersion Gold Process. Elsevier Science, 2008.
Warning: These citations may not always be 100% accurate.