Rahman, Z. A., & (Advisor), R. M. A. (2008). The study of the effect of MOS transistor scaling on the critical device parameters. Universiti Malaysia Perlis.
Chicago Style (17th ed.) CitationRahman, Zazurina Abd, and Ramzan Mat Ayub (Advisor). The Study of the Effect of MOS Transistor Scaling on the Critical Device Parameters. Universiti Malaysia Perlis, 2008.
MLA (9th ed.) CitationRahman, Zazurina Abd, and Ramzan Mat Ayub (Advisor). The Study of the Effect of MOS Transistor Scaling on the Critical Device Parameters. Universiti Malaysia Perlis, 2008.
Warning: These citations may not always be 100% accurate.