APA (7th ed.) Citation

Kamal, N. L., & (Advisor), S. N. M. (2008). Analysis of the deposited carbon during Electron Beam Induced Deposition (EBID) in Scanning Electron Microscope using Secondary Ion Mass Spectrometry (SIMS). Universiti Malaysia Perlis.

Chicago Style (17th ed.) Citation

Kamal, Nur Liana, and Shaiful Nizam Mohyar (Advisor). Analysis of the Deposited Carbon During Electron Beam Induced Deposition (EBID) in Scanning Electron Microscope Using Secondary Ion Mass Spectrometry (SIMS). Universiti Malaysia Perlis, 2008.

MLA (9th ed.) Citation

Kamal, Nur Liana, and Shaiful Nizam Mohyar (Advisor). Analysis of the Deposited Carbon During Electron Beam Induced Deposition (EBID) in Scanning Electron Microscope Using Secondary Ion Mass Spectrometry (SIMS). Universiti Malaysia Perlis, 2008.