APA (7th ed.) Citation

Saad, N. M., & (Advisor), R. M. A. (2008). Gate Oxide Integrity (GOI) Characterization For Deep Submicron CMOS Device. Universiti Malaysia Perlis.

Chicago Style (17th ed.) Citation

Saad, Norain Mohd, and Ramzan Mat Ayub (Advisor). Gate Oxide Integrity (GOI) Characterization For Deep Submicron CMOS Device. Universiti Malaysia Perlis, 2008.

MLA (9th ed.) Citation

Saad, Norain Mohd, and Ramzan Mat Ayub (Advisor). Gate Oxide Integrity (GOI) Characterization For Deep Submicron CMOS Device. Universiti Malaysia Perlis, 2008.

Warning: These citations may not always be 100% accurate.