Mohd Azizi, C., Ve, C. Y., Balakrishna, P., Uda, H., Ibrahim, A., & Bashir, M. (2010). A study for optimum productivity yield in 0.16μm mixed of wafer fabrication facility. Institute of Electrical and Electronics Engineers (IEEE).
Chicago Style (17th ed.) CitationMohd Azizi, Chik, Chun Yung Ve, Puvaneswaran Balakrishna, Hashim Uda, Ahmad Ibrahim, and Mohamad Bashir. A Study for Optimum Productivity Yield in 0.16μm Mixed of Wafer Fabrication Facility. Institute of Electrical and Electronics Engineers (IEEE), 2010.
MLA (9th ed.) CitationMohd Azizi, Chik, et al. A Study for Optimum Productivity Yield in 0.16μm Mixed of Wafer Fabrication Facility. Institute of Electrical and Electronics Engineers (IEEE), 2010.
