APA (7th ed.) Citation

Bunseng, C., Soh, C., Kang, E. S., Hui, S. K., Lim, W. J., Saad, I., & Bolong, N. (2021). High-k gate dielectric nano-FET leakage current analysis. Institute of Electrical and Electronics Engineers.

Chicago Style (17th ed.) Citation

Bunseng, Chan, Charlie Soh, Eng Siew Kang, Seng Kheong Hui, Wei Jer Lim, Ismail Saad, and Nurmin Bolong. High-k Gate Dielectric Nano-FET Leakage Current Analysis. Institute of Electrical and Electronics Engineers, 2021.

MLA (9th ed.) Citation

Bunseng, Chan, et al. High-k Gate Dielectric Nano-FET Leakage Current Analysis. Institute of Electrical and Electronics Engineers, 2021.