APA (7th ed.) Citation

Saad, I., Hamzah, M. Z., Bacho, A. H. S., C., B. S., Khairul, A. M., Ghosh, B. K., & Bolong, N. (2017). Enhanced reliability of vertical strained impact ionization MOSFET incorporating dielectric pocket for ultra-sensitive biosensor applications. American Scientific Publishers.

Chicago Style (17th ed.) Citation

Saad, Ismail, Mohd Zuhir Hamzah, Andee Hazwani Syazana Bacho, Bun Seng C., A. M. Khairul, Bablu K. Ghosh, and Nurmin Bolong. Enhanced Reliability of Vertical Strained Impact Ionization MOSFET Incorporating Dielectric Pocket for Ultra-sensitive Biosensor Applications. American Scientific Publishers, 2017.

MLA (9th ed.) Citation

Saad, Ismail, et al. Enhanced Reliability of Vertical Strained Impact Ionization MOSFET Incorporating Dielectric Pocket for Ultra-sensitive Biosensor Applications. American Scientific Publishers, 2017.