Electrical and optical characterization of Mg doping in GaN

Apossible evidence of Mg related emission in Mg doped GaN material is observed inoptical measurement, even without thermal annealing. Meanwhile, the electrical properties of the sample improve when Ni/Au contact layer was annealed up to 400°C, but degrade at further temperature. We propose that suc...

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Main Authors: Azimah, E., Zainal, N., Hassan, Z., Shuhaimi, A., Bahrin, A.
Format: Article
Language:en
Published: Trans Tech Publications, Switzerland 2013
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Online Access:http://eprints.um.edu.my/9783/1/00011485_86655.pdf
http://eprints.um.edu.my/9783/
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author Azimah, E.
Zainal, N.
Hassan, Z.
Shuhaimi, A.
Bahrin, A.
author_facet Azimah, E.
Zainal, N.
Hassan, Z.
Shuhaimi, A.
Bahrin, A.
author_sort Azimah, E.
building UM Library
collection Institutional Repository
content_provider Universiti Malaya
content_source UM Research Repository
continent Asia
country Malaysia
description Apossible evidence of Mg related emission in Mg doped GaN material is observed inoptical measurement, even without thermal annealing. Meanwhile, the electrical properties of the sample improve when Ni/Au contact layer was annealed up to 400°C, but degrade at further temperature. We propose that such behavior isrelated to degradation of surface morphology of metal contact at higher temperature.
format Article
id my.um.eprints-9783
institution Universiti Malaya
language en
publishDate 2013
publisher Trans Tech Publications, Switzerland
record_format eprints
spelling my.um.eprints-97832014-04-28T02:20:59Z http://eprints.um.edu.my/9783/ Electrical and optical characterization of Mg doping in GaN Azimah, E. Zainal, N. Hassan, Z. Shuhaimi, A. Bahrin, A. QC Physics T Technology (General) Apossible evidence of Mg related emission in Mg doped GaN material is observed inoptical measurement, even without thermal annealing. Meanwhile, the electrical properties of the sample improve when Ni/Au contact layer was annealed up to 400°C, but degrade at further temperature. We propose that such behavior isrelated to degradation of surface morphology of metal contact at higher temperature. Trans Tech Publications, Switzerland 2013 Article PeerReviewed application/pdf en http://eprints.um.edu.my/9783/1/00011485_86655.pdf Azimah, E. and Zainal, N. and Hassan, Z. and Shuhaimi, A. and Bahrin, A. (2013) Electrical and optical characterization of Mg doping in GaN. Advanced Materials Research, 620. pp. 453-457. DOI https://doi.org/10.4028/www.scientific.net/AMR.620.453 <https://doi.org/10.4028/www.scientific.net/AMR.620.453>. doi:10.4028/www.scientific.net/AMR.620.453
spellingShingle QC Physics
T Technology (General)
Azimah, E.
Zainal, N.
Hassan, Z.
Shuhaimi, A.
Bahrin, A.
Electrical and optical characterization of Mg doping in GaN
title Electrical and optical characterization of Mg doping in GaN
title_full Electrical and optical characterization of Mg doping in GaN
title_fullStr Electrical and optical characterization of Mg doping in GaN
title_full_unstemmed Electrical and optical characterization of Mg doping in GaN
title_short Electrical and optical characterization of Mg doping in GaN
title_sort electrical and optical characterization of mg doping in gan
topic QC Physics
T Technology (General)
url http://eprints.um.edu.my/9783/1/00011485_86655.pdf
http://eprints.um.edu.my/9783/
url_provider http://eprints.um.edu.my/