Rashid, N., Ritikos, R., Goh, B., Gani, S., Muhamad, M., & Rahman, S. (2011). Effects of thermal annealing on the properties of highly reflective Nc-Si: H/A-Cnx: H multilayer films prepared by rf PECVD technique.
Chicago Style (17th ed.) CitationRashid, N.M.A, R. Ritikos, B.T Goh, S.M.A Gani, M.R Muhamad, and S.A Rahman. Effects of Thermal Annealing on the Properties of Highly Reflective Nc-Si: H/A-Cnx: H Multilayer Films Prepared by Rf PECVD Technique. 2011.
MLA (9th ed.) CitationRashid, N.M.A, et al. Effects of Thermal Annealing on the Properties of Highly Reflective Nc-Si: H/A-Cnx: H Multilayer Films Prepared by Rf PECVD Technique. 2011.
Warning: These citations may not always be 100% accurate.
