Mohamad Zaidi, U. Z., Bushroa, A. R., Ghahnavyeh, R. R., & Mahmoodian, R. (2019). Crystallite size and microstrain: XRD line broadening analysis of AgSiN thin films. Emerald.
Chicago Style (17th ed.) CitationMohamad Zaidi, Umi Zalilah, Abdul Razak Bushroa, Reza Rahbari Ghahnavyeh, and Reza Mahmoodian. Crystallite Size and Microstrain: XRD Line Broadening Analysis of AgSiN Thin Films. Emerald, 2019.
MLA (9th ed.) CitationMohamad Zaidi, Umi Zalilah, et al. Crystallite Size and Microstrain: XRD Line Broadening Analysis of AgSiN Thin Films. Emerald, 2019.
Warning: These citations may not always be 100% accurate.
