Yusof, H., Soin, N., & Murti, W. (2015). HCI degradation effect on VDMOS transistor with geometric and process variations. Research India Publications.
Chicago Style (17th ed.) CitationYusof, H.H.M, N. Soin, and W.B Murti. HCI Degradation Effect on VDMOS Transistor with Geometric and Process Variations. Research India Publications, 2015.
MLA (9th ed.) CitationYusof, H.H.M, et al. HCI Degradation Effect on VDMOS Transistor with Geometric and Process Variations. Research India Publications, 2015.
Warning: These citations may not always be 100% accurate.