APA (7th ed.) Citation

Goh, K., Haseeb, A. M. A., & Wong, Y. (2016). Physical and electrical properties of thermal oxidized Sm2O3 gate oxide thin film on Si substrate: Influence of oxidation durations. Elsevier.

Chicago Style (17th ed.) Citation

Goh, K.H, A.S. Md. Abdul Haseeb, and Y.H Wong. Physical and Electrical Properties of Thermal Oxidized Sm2O3 Gate Oxide Thin Film on Si Substrate: Influence of Oxidation Durations. Elsevier, 2016.

MLA (9th ed.) Citation

Goh, K.H, et al. Physical and Electrical Properties of Thermal Oxidized Sm2O3 Gate Oxide Thin Film on Si Substrate: Influence of Oxidation Durations. Elsevier, 2016.