Wong, Y., & Cheong, K. (2013). Electrical study of ZrO2/Si system formed at different oxidation/nitridation temperatures for extended duration in N2O ambient. Materials Research Society.
Chicago Style (17th ed.) CitationWong, Y.H, and K.Y Cheong. Electrical Study of ZrO2/Si System Formed at Different Oxidation/nitridation Temperatures for Extended Duration in N2O Ambient. Materials Research Society, 2013.
MLA (9th ed.) CitationWong, Y.H, and K.Y Cheong. Electrical Study of ZrO2/Si System Formed at Different Oxidation/nitridation Temperatures for Extended Duration in N2O Ambient. Materials Research Society, 2013.
Warning: These citations may not always be 100% accurate.