Effect of damage on the etching and X-ray diffraction properties of zircon
The etching time of zircons with different amounts of radiation damage is measured. It is found that as track density increases, a shorter etching time is needed to reveal the tracks. The change in X-ray diffraction angle (20) of the (112) plane for zircon with different amounts of radiation damage...
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| Format: | Article |
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Elsevier
1988
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| Online Access: | http://eprints.um.edu.my/12158/ http://www.sciencedirect.com/science/article/pii/1359018988901136 http://dx.doi.org/10.1016/1359-0189(88)90113-6 |
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