Mohd Shahril, N. S. (2010). Characterization on a-SiC thin film by X-ray diffraction, Raman spectroscopy and infrared radiation spectroscopy / Nur Syuhada Mohd Shahril.
Chicago Style (17th ed.) CitationMohd Shahril, Nur Syuhada. Characterization on A-SiC Thin Film by X-ray Diffraction, Raman Spectroscopy and Infrared Radiation Spectroscopy / Nur Syuhada Mohd Shahril. 2010.
MLA (9th ed.) CitationMohd Shahril, Nur Syuhada. Characterization on A-SiC Thin Film by X-ray Diffraction, Raman Spectroscopy and Infrared Radiation Spectroscopy / Nur Syuhada Mohd Shahril. 2010.
Warning: These citations may not always be 100% accurate.