APA (7th ed.) Citation

Muhammad, M. K. (2009). Comparison study of lightly doped drain (LDD) and double diffused drain (DDD) to overcome hot carrier effect on 0.3um NMOS.

Chicago Style (17th ed.) Citation

Muhammad, Mohd Khairi. Comparison Study of Lightly Doped Drain (LDD) and Double Diffused Drain (DDD) to Overcome Hot Carrier Effect on 0.3um NMOS. 2009.

MLA (9th ed.) Citation

Muhammad, Mohd Khairi. Comparison Study of Lightly Doped Drain (LDD) and Double Diffused Drain (DDD) to Overcome Hot Carrier Effect on 0.3um NMOS. 2009.