Effect of low-energy proton radiation on the degradation of silicon carbide Schottky diodes
Silicon carbide (SiC) Schottky diodes are gaining traction for their potential in high-voltage, high-temperature, and radiation-resistant applications. While superior to traditional silicon (Si) diodes, their radiation hardness requires further exploration, particularly at lower energies. Although h...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | en en en |
| Published: |
Springer
2025
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/125590/1/125590_Effect%20of%20low-energy%20proton.pdf http://irep.iium.edu.my/125590/2/125590_Effect%20of%20low-energy%20proton_SCOPUS.pdf http://irep.iium.edu.my/125590/3/125590_Effect%20of%20low-energy%20proton_WOS.pdf http://irep.iium.edu.my/125590/ https://link.springer.com/article/10.1007/s11664-025-11939-y |
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http://irep.iium.edu.my/125590/1/125590_Effect%20of%20low-energy%20proton.pdfhttp://irep.iium.edu.my/125590/2/125590_Effect%20of%20low-energy%20proton_SCOPUS.pdf
http://irep.iium.edu.my/125590/3/125590_Effect%20of%20low-energy%20proton_WOS.pdf
http://irep.iium.edu.my/125590/
https://link.springer.com/article/10.1007/s11664-025-11939-y
